Saturday, March 17, 2007

Functional test tool

Interesting item about an innovative test tool in electronics talk. It's called ScanExpress JET and its from Corelis.

"It combine boundary-scan and functional test technologies to achieve higher test coverage. Dubbed JTAG Emulation Test (JET), the software combines common pin and net-level diagnostics using boundary-scan testing with CPU emulation testing through its JTAG port. This provides functional test capabilities for designs using JTAG compatible CPUs to even non-JTAG peripheral components including analogue parts connected within the CPU address and I/O space.
This means that sound structural tests for opens and shorts can be performed via boundary-scan while at-speed functional testing can be performed using the CPU to run test programs loaded into memory.
Before loading test programs into on-board memory, ScanExpress JET is using a proprietary technique to test the on-board memory at speed without loading any code into this memory.


ScanExpress JET carries existing boundary-scan testing to the next level.
Because no single test technology offers 100% test coverage, test engineers are constantly looking at ways to combine the strengths of each test methodology and maximise the overall testability of their products.
ScanExpress JET now offers a feasible way to close the gap between boundary-scan testing and functional testing.
Using a single software and hardware tool to combine the two technologies reduces test integration time yet still provides greater test coverage.
Users can access prebuilt functional tests or create functional test scripts from scratch to test non-standard parts."


Application load testing